Vol.2 No.10 <August>
SPECIAL FEATURES
2004.08.10 Published
Contents
SPECIAL FEATURES
- Expansion of Submicron Region Analysis by Electron Micro-Analyzer
- Development of High-Accuracy Evaluation Method for Electron Beam Irradiation Damage
- Development of He Plasma Ion Source
- -High-efficiency ionization technology-
- Ultratrace Characterization by High-Selectivity Separation Method
NIMS NEWS
- MOU with National Nano Device Laboratories in Taiwan
- NIMS Ecomaterials Center Signs MOU with Switzerland's EMPA
- NIMS Signs MOUs with Two South African Governmental Research Institutes
- NIMS Siigns MOU with Nanjing University
- MOU with University off Connecticutt in the U.S.
- Appointment of New Vice President
Hello from NIMS
- Interdisciplinary Research: Key for Environmental Materials
- Nitin K. Labhsetwar (NEERI, India)
Visiting Research Fellow (Jun, 2004-Jul, 2004)
Electroceramics Group, Advanced Materials Laboratory (AML) - Life Enriching Experience
- Joka Buha (University of New South Wales, Australia)
Joint International Graduate School Program
(Apr. 2004 - Jul. 2004)
Metallic Nanostructure Group
Materials Engineering Laboratory (MEL)
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