Vol.3 No.12 <December>

Special Features: Leading-Edge Electron Microscope Technology Supporting Nanotechnology

2005.12.10 Published


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Contents

Special Features: Leading-Edge Electron Microscope Technology Supporting Nanotechnology

The Role of the High Voltage Electron Microscopy Station
- Electron Microscopy for Nanotechnology and the 21st Century -
Research Achievements in Nanotechnology Support
The State of the Art in Advanced Electron Microscopy
- Aberration-Correction Technology and Internet Microscopy Technology -
Materials Research using Cryogenic-Temperature Lorentz Electron Microscope
Precise Analysis of Structural Order and Disorder in Co-Based Layered Cuprates
Advanced Materials Analysis using TEM-EELS
Fabrication of Nanostructures Utilizing Substrate Surface Charge Phenomenon and Atomic Level Analysis of the New Nanostructures
- Development of New Nanostructure using Electron Beam Technique -
Nanofabrication at the 1 nm Level using Focused Electron Beam

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Igor Solovyev (Russia)
Yan Ma (China)