Vol.11 No.05 <June>
Seeing the nano world.
NIMS Transmission Electron Microscopy Station.
2013.07.22 Published
Contents
Seeing the nano world
NIMS Transmission Electron Microscopy Station
-Real working environment nanoscale physical characterization TEM
-300 kV field emission-type transmission electron microscope
-200 kV field emission-type transmission electron microscope
-Field emission-type scanning electron microscope
-TEM sample preparation facilities
-Focused ion beam device
-300 kV field emission-type transmission electron microscope
-200 kV field emission-type transmission electron microscope
-Field emission-type scanning electron microscope
-TEM sample preparation facilities
-Focused ion beam device
NIMS News
- NIMS and DENKA Establish the "NIMS-DENKA Center of Excellence for Next Generation Materials"
- Vice Chancellor of UTM visits NIMS.
- Hello from NIMS