The 135th AMCP Open Seminar
Scanning Probe Thermoscopy and Heat Transport Physics
Schedules 2018.11.30 Finished
Date & Time
Venue
Sengen Main Bldg. 8F Middle Seminar Room → access
Registration
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.
Speaker
Title
Abstract
In this seminar, I will present experimental routs to characterize local energy dissipation in nanoscale electronic devices [1,2] and thermal transport in molecular structures [3,4] based on scanning probe microscopy and micro-electromechanical systems (MEMS) with integrated temperature sensors [5]. Based on numerous examples, I will illustrate how scanning probe thermometry enables the real-space imaging of local Joule and Peltier effects in semiconductor devices down to 10 nm spatial and tens of pico-Watt heat flux resolution [1]. In addition, I will discuss the study of thermal transport across scaled contacts [6], ultimately demonstrating the validity of fundamental charge and heat transfer relations down to the atomic scale [5].
Finally, I will provide an outlook on our developments of energy and time-resolved photo-thermal scanning probe techniques [4], and their unique potential to unravel local thermo-physical processes in quantum materials and molecular systems.
References:
[1] F. Menges et al., Temperature mapping of operating nanoscale devices by scanning probe thermometry, Nature Com. 7, 10874, 2016.
[2] F. Menges et al., Nanoscale thermometry by scanning thermal microscopy, Review of Scientific Instruments (87) 7, 074902, 2016.
[3] T. Meier et al., Length-dependent thermal transport along molecular chains, Physical review letters 113 (6), 060801, 2014.
[4] BT. O’Callahan et al, Photo-induced tip-sample forces for chemical nanoimaging and spectroscopy,Nano-letters 18(9), 5499-5505, 2018.
[5] N. Mosso et al., Heat transport through atomic contacts, Nature Nanotechnology 12, 430-433, 2017.
[6] F. Menges et al., Thermal transport into graphene through nanoscopic contacts, Physical review letters 111 (20), 205901, 2013.
Related File / Link
- Research Center for Advanced Measurement and Characterization
- Advanced Measurement and Characterization Project
- Research Center for Advanced Measurement and Characterization
Summary
- Event Title
-
The 135th AMCP Open Seminar
Scanning Probe Thermoscopy and Heat Transport Physics - Venue
- National Institute for Materials Science (NIMS)
Sengen Central Building 8F Middle Seminar Room - Schedules Hours
-
2018.11.30
11:00-12:00 - Registration Fee
- Free
Contact
-
Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-2643/2839
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
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