The 140th AMCP Open Seminar
1. Probing the Solid/Gas Interface of Solid State Electrochemical Devices with X-Ray Spectroscopic Methods
2. Towards Universal Liquid in-situ Electrochemistry in Photoemission Microscopy
Schedules 2019.03.18 Finished
Date & Time
Venue
Sengen Central Bldg. 1F Meeting Room No.2
Registration
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.
Speaker
(2) Dr. Thomas Duchon, Postdoctoral Researcher, Peter Grünberg Institute (PGI-6), Research Center Juelich, Germany.
Title
(2) Towards Universal Liquid in-situ Electrochemistry in Photoemission Microscopy
Abstract
(2)The use of photoemission electron microscopy (PEEM) as a probe of liquid electrolytes has been an elusive goal, motivated by the breadth of information the technique can provide, but hindered by many technical difficulties. The traditional concept of differential pumping is challenging to implement in PEEM due to the presence of a high potential difference between a specimen and extractor lens. One of the ways to overcome the problem is to use electron transparent membranes to seal the liquid sample, thus retaining high vacuum conditions between the lens and sample. Here, we present the current approaches that allow for investigation of interfacial liquid electrochemistry via either soft or hard X-ray PEEM, offering a rare combination of morphological, chemical and structural information with real-time imaging of electrodes and products of electrolysis, electrodeposition, and other electrically induced processes.
Related File / Link
- Research Center for Advanced Measurement and Characterization
- Advanced Measurement and Characterization Project
- Research Center for Advanced Measurement and Characterization
Summary
- Event Title
-
The 140th AMCP Open Seminar
1. Probing the Solid/Gas Interface of Solid State Electrochemical Devices with X-Ray Spectroscopic Methods
2. Towards Universal Liquid in-situ Electrochemistry in Photoemission Microscopy - Venue
- National Institute for Materials Science (NIMS)
Sengen Central Bldg. 1F Meeting Room No.2 - Schedules Hours
-
2019.03.18
13:00-15:00 - Registration Fee
- Free
Contact
-
Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-2643/2839
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
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