第87回先端計測オープンセミナー

2016年11月14日(月) 13 : 30~14 : 50

国立研究開発法人 物質・材料研究機構 千現地区 研究本館8階 中セミナー室
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1. Dr. Misa Hayashida (National Institute for Nanotechnology, Edmonton, Canada)

2. Prof. Marek Malac (National Institute for Nanotechnology, Edmonton, Canada)

1. Recent developments in TEM tomography and the future prospects

2. Hole free phase plate imaging in a TEM

1. Electron tomography in a transmission electron microscope is widely used to obtain three dimensional (3D) visualization of nanoscale objects in both materials and life sciences. I have focused on development of quantitative electron tomography for the past several years. In this presentation, I will explain principle of electron tomography and our recent results at NINT. I also discuss some of the limitations and opportunities in electron tomography development.

2. Zernike-like phase plate contrast can be obtained in a transmission electron microscope by introducing a phase shift between direct and diffracted beams in the back focal plane of objective lens. A particularly convenient implemenation utilizes a uniform thin film with its contrast transfer properties determined by local modifications of the film by the primary electron beam. The need for accurate positioning of the device in back focal plane is eliminated because the phase shifting patch size and position is determined by the primary beam size and position. Such hole free phase plate can increase image contrast by a factor of two to four. While hole free phase plate contrast can not be quantitatively interpreted at present, it can be used to image for example magnetic field inside sample and fringing field in vacuum near sample. It can be also applied to imaging of biological materials. The origin of the hole free phase plate phase shift is not fully understood. In this prentation, example applications and recent development of the contrast origin will be discussed.