The 105th AMCP Open Seminar
Nano-structured device observation by synchrotron soft X-ray scanning photoelectron microscopy and development towards multidimensional analysis
Schedules 2017.08.09 Finished
Date & Time
Venue
Sengen Main Bldg. 8F Middle Seminar Roo → access
Registration
For inquiries, please contact the Administrative Office.
This lecture is open to the public. Your participation is strongly encouraged.
Speaker
Title
Related File / Link
- Research Center for Advanced Measurement and Characterization
- Advanced Measurement and Characterization Project
- Research Center for Advanced Measurement and Characterization
Summary
- Event Title
-
The 105th AMCP Open Seminar
Nano-structured device observation by synchrotron soft X-ray scanning photoelectron microscopy and development towards multidimensional analysis - Venue
- National Institute for Materials Science (NIMS)
Sengen Main Bldg. 8F Middle Seminar Room - Schedules Hours
-
2017.08.09
15:00~16:00 - Registration Fee
- Free
Contact
-
Research Center for Advanced Measurement and Characterization Administrative Office
National Institute for Materials Science
1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Tel:81-29-859-3861
Fax:81-29-859-2801
E-Mail: amc=ml.nims.go.jp(Please change "=" to "@")
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